This characterization is essential for quality control ... will lead to the discovery of novel nanomechanical phenomena and the design of multifunctional nanomaterials and nanodevices.

Conductive atomic force microscopy (C-AFM) is a powerful nanoscale characterization technique that combines the high-resolution ... providing valuable insights into the structure-property ...

ACS Nano publishes comprehensive articles on synthesis, assembly, characterization, theory, and simulation of nanostructures (nanomaterials and assemblies, nanodevices, and self-assembled structures), ...