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【测试案例分享】 如何评估热载流子引导的MOSFET衰退
随着 MOSFET 栅极长度的减小,热载流子诱发的退化已成为重要的可靠性问题之一。在热载流子效应中,载流子被通道电场加速并被困在氧化物中。这些被捕获的电荷会引起测量器件参数的时间相关位移,例如阈值电压 (VTH)、跨导 (GM)以及线性 (IDLIN ...
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